We use cookies to distinguish you from other users and to provide you with a better experience on our websites. Close this message to accept cookies or find out how to manage your cookie settings.
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Type
On Demand - Artificial Intelligence, Instrument Automation, and High-Dimensional Data Analytics for Microscopy and Microanalysis
Rauch, E.F., Dupuy, L., Rapid Spot Diffraction Pattern Identification Through Template Matching, Archives of Metallurgy and Materials50 (2005), 87-99.Google Scholar
[2]
Zaefferer, S., and Wu, G., Development of a TEM-based Orientation Microscopy System. Applications of Texture Analysis (2008), 221-228.10.1002/9780470444214.ch24CrossRefGoogle Scholar
[3]
Martineau, B. et al. , Unsupervised machine learning applied to scanning precession electron diffraction data. Advanced Structural and Chemical Imaging (2019), doi:10.1186/s40679-019-0063-3.CrossRefGoogle Scholar
[4]
Alexander, Z. et al. , Blind Source Separation in SPED datasets: Machine learning assisted phase and orientation determination in multilayer oxide electronic thin film devices (2020).Google Scholar
[5]
Aguiar, J. A. et al. , Decoding crystallography from high-resolution electron imaging and diffraction datasets with deep learning, Science Advances (2019), doi:10.1126/sciadv.aaw1949.Google ScholarPubMed
[6]
Xu, M., Kumar, A., and LeBeau, J., Automating Electron Microscopy through Machine Learning and USETEM, Microsc. Microanal. 27 (2021), p. 2988. doi:10.1017/S14319276211010394.CrossRefGoogle Scholar
[7]
Munshi, J. et al. , 4D >Crystal: Deep Learning Crystallographic Information from Electron Diffraction Images, Microsc. Microanal. 27 (2021), p. 2774. doi:10.1017/S1431927621009739.CrossRefGoogle Scholar
[8]
Kikuchi, J.-i. and Yasuhara, K. (2012). Transmission Electron Microscopy (TEM). In Supramolecular Chemistry (eds Gale, P.A. and Steed, J.W.). doi:10.1002/9780470661345.smc022.Google Scholar
[9]
Shi, C. et al. , Rapid and Semi-Automated Analysis of 4D-STEM data via Unsupervised Learning, Microsc. Microanal. 27 (2021), p. 58. doi:10.1017/S1431927621000805.CrossRefGoogle Scholar
H. Jin, Q. Song, and Xi Hu. Auto-keras: An efficient neural architecture search system. Proceedings of the 25th SIGKDD International Conference on Knowledge Discovery & Data Mining. ACM, 2019.10.1145/3292500.3330648CrossRefGoogle Scholar