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The NCEM One-Angstrom Microscope Project Reaches 0.89Å Resolution

Published online by Cambridge University Press:  02 July 2020

Michael A. O'Keefe
Michael A. O'Keefe*
Affiliation:
National Center for Electron Microscopy, MSD, LBNL B72, Berkeley, CA94720
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Transmission electron microscopy to a resolution of 0.89Å has been achieved at the National Center for Electron Microscopy and is available to electron microscopists who have a requirement for this level of resolution. Development of this capability commenced in 1993, when the National Center for Electron Microscopy agreed to fund a proposal for a unique facility, a one- Ångstrom microscope (OÅM).2 The OÅM project provides materials scientists with transmission electron microscopy at a resolution better than one Angstrom by exploiting the significantly higher information limit of a FEG-TEM over its Scherzer resolution limit. To turn the misphased information beyond the Scherzer limit into useful resolution, the OÅM requires extensive image reconstruction. One method chosen was reconstruction from off-axis holograms; another was reconstruction from focal series of underfocused images. The OÅM is then properly a combination of a FEG-TEM (a CM300FEG-UT) together with computer software able to generate sub-Ångstrom images from experimental images obtained on the FEG-TEM.

Before the advent of the OÅM, NCEM microscopists relied on image simulation to obtain structural information beyond the TEM resolution limit.

Type
Microscopy Milestones of the Last Millenium
Information
Microscopy and Microanalysis , Volume 6 , Issue S2: Proceedings: Microscopy & Microanalysis 2000, Microscopy Society of America 58th Annual Meeting, Microbeam Analysis Society 34th Annual Meeting, Microscopical Society of Canada/Societe de Microscopie de Canada 27th Annual Meeting, Philadelphia, Pennsylvania August 13-17, 2000 , August 2000 , pp. 1192 - 1193
Copyright
Copyright © Microscopy Society of America

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