Hostname: page-component-586b7cd67f-tf8b9 Total loading time: 0 Render date: 2024-11-28T10:37:44.279Z Has data issue: false hasContentIssue false
  • English
  • Français

Nanoscale Imaging of Structural and Optical Properties Using Helium Temperature Scanning Transmission Electron Microscopy Cathodoluminescence of Nitride Based Nanostructures

Published online by Cambridge University Press:  25 July 2016

Frank Bertram ,
Marcus Müller ,
Gordon Schmidt ,
Peter Veit ,
Silke Petzold ,
Steven Albert ,
Ana María Bengoechea-Encabo ,
Miguel Ángel Sánchez-Garcia ,
Enrique Calleja  and
Jürgen Christen
Frank Bertram
Affiliation:
Institute of Experimental Physics, Otto-von-Guericke-University Magdeburg, Germany
Marcus Müller
Affiliation:
Institute of Experimental Physics, Otto-von-Guericke-University Magdeburg, Germany
Gordon Schmidt
Affiliation:
Institute of Experimental Physics, Otto-von-Guericke-University Magdeburg, Germany
Peter Veit
Affiliation:
Institute of Experimental Physics, Otto-von-Guericke-University Magdeburg, Germany
Silke Petzold
Affiliation:
Institute of Experimental Physics, Otto-von-Guericke-University Magdeburg, Germany
Steven Albert
Affiliation:
ISOM and Departamento de Ingenieria Electronica, Universidad Politecnica de Madrid, Spain
Ana María Bengoechea-Encabo
Affiliation:
ISOM and Departamento de Ingenieria Electronica, Universidad Politecnica de Madrid, Spain
Miguel Ángel Sánchez-Garcia
Affiliation:
ISOM and Departamento de Ingenieria Electronica, Universidad Politecnica de Madrid, Spain
Enrique Calleja
Affiliation:
ISOM and Departamento de Ingenieria Electronica, Universidad Politecnica de Madrid, Spain
Jürgen Christen
Affiliation:
Institute of Experimental Physics, Otto-von-Guericke-University Magdeburg, Germany

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 600 - 601
Copyright
© Microscopy Society of America 2016