Hostname: page-component-78c5997874-v9fdk Total loading time: 0 Render date: 2024-11-02T22:03:02.442Z Has data issue: false hasContentIssue false
  • English
  • Français

Nanoscale Analysis by EFTEM and FIB-Tomography for Optimization of Thin-Film Silicon Solar Cells

Published online by Cambridge University Press:  01 August 2010

DTL Alexander ,
S Nicolay ,
P Cuony ,
M Cantoni  and
C Ballif
DTL Alexander
Affiliation:
École Polytechnique Fédérale de Lausanne, Switzerland
S Nicolay
Affiliation:
École Polytechnique Fédérale de Lausanne, Switzerland
P Cuony
Affiliation:
École Polytechnique Fédérale de Lausanne, Switzerland
M Cantoni
Affiliation:
École Polytechnique Fédérale de Lausanne, Switzerland
C Ballif
Affiliation:
École Polytechnique Fédérale de Lausanne, Switzerland

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1336 - 1337
Copyright
Copyright © Microscopy Society of America 2010