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Nanoprobe Endstation with Montel optics and Resolution 50 nm at Taiwan Photon Source

Published online by Cambridge University Press:  10 August 2018

Gung-Chian Yin ,
Bo-Yi Chen ,
Chien-Yu Lee ,
Huang-Yeh Chen ,
Bi-Hsuan Lin ,
Shao-Chin Tseng ,
Xiao-Yun Li ,
Jian-Xing Wu ,
Shi-Hung Chang  and
Mau-Tsu Tang
Gung-Chian Yin*
Affiliation:
National Synchrotron Radiation Research Center, Hsinchu, Taiwan.
Bo-Yi Chen
Affiliation:
National Synchrotron Radiation Research Center, Hsinchu, Taiwan.
Chien-Yu Lee
Affiliation:
National Synchrotron Radiation Research Center, Hsinchu, Taiwan.
Huang-Yeh Chen
Affiliation:
National Synchrotron Radiation Research Center, Hsinchu, Taiwan.
Bi-Hsuan Lin
Affiliation:
National Synchrotron Radiation Research Center, Hsinchu, Taiwan.
Shao-Chin Tseng
Affiliation:
National Synchrotron Radiation Research Center, Hsinchu, Taiwan.
Xiao-Yun Li
Affiliation:
National Synchrotron Radiation Research Center, Hsinchu, Taiwan.
Jian-Xing Wu
Affiliation:
National Synchrotron Radiation Research Center, Hsinchu, Taiwan.
Shi-Hung Chang
Affiliation:
National Synchrotron Radiation Research Center, Hsinchu, Taiwan.
Mau-Tsu Tang
Affiliation:
National Synchrotron Radiation Research Center, Hsinchu, Taiwan.
*
*Corresponding author, [email protected]

Abstract

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Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 208 - 209
Copyright
© Microscopy Society of America 2018 

References

[1] Yin, G.-C., et al, AIP Conference Proceedings 1696 2016 020026.Google Scholar
[2] Yin, G.-C., et al Proc. SPIE 9592, X-Ray Nanoimaging: Instruments and Methods. II, 959204.Google Scholar
[3] Liu, W., et al, Journal of Synchrotron Radiation 18 2011 575–579.Google Scholar
[4] Liu, C., et al, Applied Surface Science 258 2012 2182–2186.Google Scholar
[5] Yamauchi, K., et al, Review of Scientific Instruments 73 2002 4028–4033.Google Scholar
[6] Chen, B.Y., et al, MEDSI2016 Proccedings 2017 57–59.Google Scholar
[7] Lin, B.-H., et al, Applied Physics Letters 109 2016 192104.Google Scholar
[8] Lin, B.-H., et al, Optics express 26, 2731–2739, 2018.Google Scholar