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Nano/micro scale characterization of SiC/SiC composite materials

Published online by Cambridge University Press:  23 November 2012

D. Frazer ,
P. Hosemann ,
C.A. Back ,
C. Deck  and
H. Khalifa
D. Frazer
Affiliation:
Nuclear Engineering, University of California Berkeley, Berkeley, CA
P. Hosemann
Affiliation:
Nuclear Engineering, University of California Berkeley, Berkeley, CA
C.A. Back
Affiliation:
General Atomics, San Diego, CA
C. Deck
Affiliation:
General Atomics, San Diego, CA
H. Khalifa
Affiliation:
General Atomics, San Diego, CA
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1420 - 1421
Copyright
Copyright © Microscopy Society of America 2012

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