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Nanometric-scale Characterization of Mechanical Properties of Materials by Atomic Force Microscopy

Published online by Cambridge University Press:  06 August 2003

Ya. M. Soifer ,
A. Verdyan ,
I. Lapsker  and
J. Azoulay
Ya. M. Soifer
Affiliation:
Holon Academic Institute of Technology, Sciences Dept, P.O. Box 305, Holon 58102, Israel
A. Verdyan
Affiliation:
Holon Academic Institute of Technology, Sciences Dept, P.O. Box 305, Holon 58102, Israel
I. Lapsker
Affiliation:
Holon Academic Institute of Technology, Sciences Dept, P.O. Box 305, Holon 58102, Israel
J. Azoulay
Affiliation:
Holon Academic Institute of Technology, Sciences Dept, P.O. Box 305, Holon 58102, Israel

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 196 - 197
Copyright
Copyright © Microscopy Society of America 2003