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Nanometric Scale Investigation of Local Strain in GaInAs Islands by High Resolution and Analytical TEM

Published online by Cambridge University Press:  09 January 2003

J.Y. Laval ,
S. Kret ,
C. Delamarre ,
P. Bassoul ,
T. Benabbas  and
Y. Androussi
J.Y. Laval
Affiliation:
Laboratoire de Physique du Solide, CNRS-ESPCI, 10 rue Vauquelin, 75231 Paris 05, France
S. Kret
Affiliation:
Laboratoire de Physique du Solide, CNRS-ESPCI, 10 rue Vauquelin, 75231 Paris 05, France
C. Delamarre
Affiliation:
Laboratoire de Physique du Solide, CNRS-ESPCI, 10 rue Vauquelin, 75231 Paris 05, France
P. Bassoul
Affiliation:
Laboratoire de Physique du Solide, CNRS-ESPCI, 10 rue Vauquelin, 75231 Paris 05, France
T. Benabbas
Affiliation:
Laboratoire de Structure et Propriétés de l'Etat Solide, USTL, 59655, Villeneuve d'Ascq, France
Y. Androussi
Affiliation:
Laboratoire de Structure et Propriétés de l'Etat Solide, USTL, 59655, Villeneuve d'Ascq, France
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Abstract

The continuous displacement field within elastically relaxed GaInAs islands was calculated from digitized HREM images of {110} cross sections of In0.35Ga0.65As layers grown on GaAs by molecular beam epitaxy. Experimental maps of the deformations parallel to the interface (εx) and along the growth direction (εz) were drawn and compared with the ones calculated via the finite element method. It was found that εx exp was systematically higher than εx calc and the significant maximum observed for εz exp within the island could not be found for εz calc. These discrepancies were attributed to a variation of the chemical composition in the island. The maps showing the indium concentration gradient drawn from HREM and FE calculations were compared to quantitative profiles for indium concentration obtained by nanometric X-ray microanalysis in TEM. The measured gradient within the island backs our assumption.

Keywords

GaInAsHREMlocal-strainX-ray nanoanalysisquantum dots
Type
A SYMPOSIUM IN HONOR OF PROFESSOR GARETH THOMAS
Information
Microscopy and Microanalysis , Volume 8 , Issue 4 , August 2002 , pp. 312 - 318
Copyright
2002 Microscopy Society of America

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