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Nanometer-scale Characterization Tools for Strain-Engineered Semiconductor Devices
Published online by Cambridge University Press: 09 October 2013
Abstract
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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
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- Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 1076 - 1077
- Copyright
- Copyright © Microscopy Society of America 2013
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