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The Nanolathe - a Dedicated Two-axis Positioner for Concentric Sample Rotation.
Published online by Cambridge University Press: 25 July 2016
Abstract
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- Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 686 - 687
- Copyright
- © Microscopy Society of America 2016
References
References:
[1]
Martin Dierolf, Andreas, Menzel, Pierre, Thibault, Philipp, Schneider, Cameron M., Kewish, Roger, Wepf, Oliver Bunk & Franz, Pfeiffer
Nature
467, 436–439, 23 September 2010
10.1038/nature09419.CrossRefGoogle Scholar
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