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Nano-Characterization of Industrial Heterogeneous Catalysts

Published online by Cambridge University Press:  02 July 2020

J. Liu  and
J.R. Ebner
J. Liu
Affiliation:
Science and Technology, Monsanto Company, St. Louis, MO, 63167
J.R. Ebner
Affiliation:
Science and Technology, Monsanto Company, St. Louis, MO, 63167
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Extract

Catalyst characterization plays a vital role in new catalyst development and in troubleshooting of commercially catalyzed processes. The ultimate goal of catalyst characterization is to understand the structure-property relationships associated with the active components and supports. Among many characterization techniques, only electron microscopy and associated analytical techniques can provide local information about the structure, chemistry, morphology, and electronic properties of industrial heterogeneous catalysts. Three types of electron microscopes are usually used for characterizing industrial supported catalysts: 1) scanning electron microscope (SEM), 2) scanning transmission electron microscope (STEM), and 3) transmission electron microscope (TEM). Each type of microscope has its unique capabilities. However, the integration of all electron microscopic techniques has proved invaluable for extracting useful information about the structure and the performance of industrial catalysts.

Commercial catalysts usually have a high surface area with complex geometric structures to enable reacting gases or fluids to access as much of the active surface of the catalyst as possible.

Type
Nanophase and Amorphous Materials
Information
Microscopy and Microanalysis , Volume 4 , Issue S2: Proceedings: Microscopy & Microanalysis '98, Microscopy Society of America 56th Annual Meeting, Microbeam Analysis Society 32nd Annual Meeting, Atlanta, Georgia July 12-16, 1998 , July 1998 , pp. 740 - 741
Copyright
Copyright © Microscopy Society of America

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References

1.Liu, J. et al., Proc. Microscopy & Microanalysis, 1995 (1995) 418; Proc. Microscopy & Microanalysis 1996 (1996) 138; Proc. Microscopy & Microanalysis 1997 (1997) 1223.Google Scholar
2.Treacy, M. M. J. and Rice, S. B., J.|Microscopy 156 (1989) 211; J. Liu and J. M. Cowley, Ultramicroscopy 34 (1990) 119.CrossRefGoogle Scholar
3.Lyman, C. E. et al., Proc. Microscopy & Microanalysis 1995 (1995) 404.Google Scholar
4.Datye, A. K. and Smith, D. J., Catal. Rev.-Sci. Eng. 34 (1992) 129.CrossRefGoogle Scholar
5.Boyes, E. D. and Gai, P. L., Ultramicroscopy 67 (1997) 219.CrossRefGoogle Scholar
6. The authors thank Dr. Peter Crozier for assistance. Part of the microscopy work was performed through the Industrial Associates Program of Arizona State University.Google Scholar