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Nanocharacterization Of Gallium Antimonide Substrate Surface By Tem/Afm

Published online by Cambridge University Press:  01 August 2002

X. Li ,
L. Allen ,
C. Santeufemio ,
W. Goodhue  and
C. Sung
X. Li
Affiliation:
Department of Chemical and Nuclear Engineering, Center for Advanced Materials, University of Massachusetts, Lowell, MA 01854
L. Allen
Affiliation:
Epion, a JDS Uniphase Company, Epion Corporation, 37 Manning Rd., Billerica, MA. 01821
C. Santeufemio
Affiliation:
Epion, a JDS Uniphase Company, Epion Corporation, 37 Manning Rd., Billerica, MA. 01821
W. Goodhue
Affiliation:
Department of Physics, Photonics Center, University of Massachusetts, Lowell, MA 01854
C. Sung
Affiliation:
Department of Chemical and Nuclear Engineering, Center for Advanced Materials, University of Massachusetts, Lowell, MA 01854

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 1258 - 1259
Copyright
Copyright © Microscopy Society of America 2002