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Nanobelt Thickness and Mean-free Path Determination by CBED and PEELS

Published online by Cambridge University Press:  01 August 2002

Y. Berta ,
C. Ma  and
Z.L. Wang
Y. Berta
Affiliation:
School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, GA 30332-0245
C. Ma
Affiliation:
School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, GA 30332-0245
Z.L. Wang
Affiliation:
School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, GA 30332-0245

Abstract

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Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 1608 - 1609
Copyright
Copyright © Microscopy Society of America 2002