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Multivariate Statistical Analysis of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) Spectral Images - Unbiased Analysis of the Entire 3-Dimensional Data Cube

Published online by Cambridge University Press:  01 August 2005

V S Smentkowski
V S Smentkowski
Affiliation:
General Electric, Niskayuna, New York

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 442 - 443
Copyright
© 2005 Microscopy Society of America