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Multivariate Statistical Analysis of Particle X-ray Spectra

Published online by Cambridge University Press:  02 July 2020

Ian M. Anderson
Affiliation:
Metals & Ceramics Division, Oak Ridge National Laboratory, PO Box 2008, Oak Ridge, TN, 37831
John A. Small
Affiliation:
Surface & Microanalysis Science Division, NIST, Gaithersburg, MD, 20899
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Extract

Multivariate statistical analysis (MSA) is a powerful tool for the analysis of series of spectra. This paper explores an application of MSA to a series of energy dispersive X-ray (EDX) spectra acquired in the scanning electron microscope (SEM) from a series of particles. The raw data were series of spectra previously acquired to test analytical procedures for trace element detection. This paper explores the possibility of performing the trace element detection with MSA components that have been extracted from the raw data without any a priori assumptions about the information content of the particle spectra. Particles were prepared from two analytical glasses, dispersed onto carbon substrates and coated with carbon. The compositions of the two glasses are substantially similar, except that one glass (K-3106) contains 0.7 wt.% Fe, whereas the other glass (K-3069) does not contain Fe at a detectable level.

Type
30 Years of Energy Dispersive Spectrometry in Microanalysis
Copyright
Copyright © Microscopy Society of America

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References

1. Trebbia, P. and Bonnet, N., Ultramicroscopy 34(1990)165.CrossRefGoogle Scholar

2. Anderson, I.M. and Bentley, J., Proc. Microscopy & Microanalysis 1997, 931.CrossRefGoogle Scholar

3. Small, J.A., Proc. Microscopy & Microanalysis 1997, 901.CrossRefGoogle Scholar

4. Research at the Oak Ridge National Laboratory (ORNL) SHaRE User Facility was sponsored by the Division of Materials Sciences, U.S. Department of Energy, under contract DE-AC05-96OR22464 with Lockheed Martin Energy Research Corporation.Google Scholar