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Multivariate Statistical Analysis of Atom Probe Tomography Data

Published online by Cambridge University Press:  01 August 2010

MR Keenan ,
VS Smentkowski ,
RM Ulfig ,
E Oltman ,
DJ Larson  and
TF Kelly
MR Keenan
Affiliation:
Wolcott, NY
VS Smentkowski
Affiliation:
General Electric Global Research Center
RM Ulfig
Affiliation:
Imago Scientific Instruments Corporation
E Oltman
Affiliation:
Imago Scientific Instruments Corporation
DJ Larson
Affiliation:
Imago Scientific Instruments Corporation
TF Kelly
Affiliation:
Imago Scientific Instruments Corporation

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 270 - 271
Copyright
Copyright © Microscopy Society of America 2010