Hostname: page-component-586b7cd67f-t7fkt Total loading time: 0 Render date: 2024-11-28T15:05:19.774Z Has data issue: false hasContentIssue false

Multi-Species Focused Ion Beam Processing for III-V Semiconductor Materials

Published online by Cambridge University Press:  23 November 2012

B.P. Gila
Affiliation:
University of Florida, Gainesville, FL
B.R. Appleton
Affiliation:
University of Florida, Gainesville, FL
J. Fridmann
Affiliation:
RaithUSA, Ronkonkoma, NY
J.E. Sanabia
Affiliation:
RaithUSA, Ronkonkoma, NY
P. Mazarov
Affiliation:
Raith, Dortmund, Germany
Get access

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Copyright
Copyright © Microscopy Society of America 2012

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)