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Multiprobe AFM Electrical Characterization and Tip Enhanced Raman Spectroscopy of Graphene on Silicon/Silicon Oxide Substrates

Published online by Cambridge University Press:  23 November 2012

H. Taha ,
R. Dekhter ,
Y. Bar-David ,
G. Fish  and
A. Lewis
H. Taha
Affiliation:
19 Hartum Street, Nanonics Imaging Ltd., Jerusalem, Select State, Israel
R. Dekhter
Affiliation:
19 Hartum Street, Nanonics Imaging Ltd., Jerusalem, Select State, Israel
Y. Bar-David
Affiliation:
19 Hartum Street, Nanonics Imaging Ltd., Jerusalem, Select State, Israel
G. Fish
Affiliation:
19 Hartum Street, Nanonics Imaging Ltd., Jerusalem, Select State, Israel
A. Lewis
Affiliation:
Hebrew University of Jerusalem, Jerusalem, Israel
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1572 - 1573
Copyright
Copyright © Microscopy Society of America 2012

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