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Multiplexed TEM Specimen Preparation and Analysis of Plasmonic Nanoparticles

Published online by Cambridge University Press:  30 July 2015

Sėan K. Mulligan ,
Jeffrey A. Speir ,
Ivan Razinkov ,
Anchi Cheng ,
John Crum ,
Tilak Jain ,
Erika Duggan ,
Er Liu ,
John P. Nolan  and
Bridget Carragher
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Sėan K. Mulligan
Affiliation:
The National Resource for Automated Molecular Microscopy, La Jolla, CA 92037, USA
Jeffrey A. Speir
Affiliation:
The National Resource for Automated Molecular Microscopy, La Jolla, CA 92037, USA
Ivan Razinkov
Affiliation:
The National Resource for Automated Molecular Microscopy, La Jolla, CA 92037, USA New York Structural Biology Center, New York, NY 10027, USA
Anchi Cheng
Affiliation:
The National Resource for Automated Molecular Microscopy, La Jolla, CA 92037, USA New York Structural Biology Center, New York, NY 10027, USA
John Crum
Affiliation:
The National Resource for Automated Molecular Microscopy, La Jolla, CA 92037, USA
Tilak Jain
Affiliation:
The National Resource for Automated Molecular Microscopy, La Jolla, CA 92037, USA
Erika Duggan
Affiliation:
Scintillon Institute, San Diego, CA 92121, USA
Er Liu
Affiliation:
La Jolla Bioengineering Institute, San Diego, CA 92121, USA
John P. Nolan
Affiliation:
Scintillon Institute, San Diego, CA 92121, USA
Bridget Carragher
Affiliation:
The National Resource for Automated Molecular Microscopy, La Jolla, CA 92037, USA New York Structural Biology Center, New York, NY 10027, USA
Clinton S. Potter*
Affiliation:
The National Resource for Automated Molecular Microscopy, La Jolla, CA 92037, USA New York Structural Biology Center, New York, NY 10027, USA
*
*Corresponding author.[email protected]
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Abstract

We describe a system for rapidly screening hundreds of nanoparticle samples using transmission electron microscopy (TEM). The system uses a liquid handling robot to place up to 96 individual samples onto a single standard TEM grid at separate locations. The grid is then transferred into the TEM and automated software is used to acquire multiscale images of each sample. The images are then analyzed to extract metrics on the size, shape, and morphology of the nanoparticles. The system has been used to characterize plasmonically active nanomaterials.

Keywords

nanoparticlesTEMautomation
Type
Materials Applications and Techniques
Information
Microscopy and Microanalysis , Volume 21 , Issue 4 , August 2015 , pp. 1017 - 1025
Copyright
© Microscopy Society of America 2015 

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Footnotes

†

These authors contributed equally to this work.

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