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MultiLaue: A Technique to Extract d-spacings from Laue XRD

Published online by Cambridge University Press:  25 July 2016

Zack Gainsforth ,
Matthew A. Marcus ,
Nobumichi Tamura  and
Andrew J. Westphal
Zack Gainsforth
Affiliation:
University of California Berkeley, Space Sciences Laboratory, Berkeley, CA, 91020, USA
Matthew A. Marcus
Affiliation:
Lawrence Berkeley Laboratory, Advanced Light Source, Berkeley, CA, 91020, USA
Nobumichi Tamura
Affiliation:
Lawrence Berkeley Laboratory, Advanced Light Source, Berkeley, CA, 91020, USA
Andrew J. Westphal
Affiliation:
University of California Berkeley, Space Sciences Laboratory, Berkeley, CA, 91020, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1784 - 1785
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Laue, von, M. Physikalische Zeitschrift 14 (1913). p. 1075–1079.Google Scholar
[2] Tamura, N. In Strain and Dislocaton Gradients from Diffraction Spatially-Resolved Local Structure and Defects (ed R. Barabash & G. Ice, (Imperial College Press, London)) p. 125.Google Scholar
[3] The Advanced Light Source is supported by the Director, Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231.Google Scholar