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Multi- and Single-Walled Nanotubes in the B-C-N System Studied by HRTEM and EELS

Published online by Cambridge University Press:  02 July 2020

Y. Bando ,
D. Golberg ,
L. Bourgeois ,
K. Kurashima  and
T. Sato
Y. Bando
Affiliation:
National Institute for Research in Inorganic Materials, Tsukuba, Ibaraki 305-0044, Japan
D. Golberg
Affiliation:
National Institute for Research in Inorganic Materials, Tsukuba, Ibaraki 305-0044, Japan
L. Bourgeois
Affiliation:
National Institute for Research in Inorganic Materials, Tsukuba, Ibaraki 305-0044, Japan
K. Kurashima
Affiliation:
National Institute for Research in Inorganic Materials, Tsukuba, Ibaraki 305-0044, Japan
T. Sato
Affiliation:
National Institute for Research in Inorganic Materials, Tsukuba, Ibaraki 305-0044, Japan
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Extract

Discoveries of C multi-walled (MWNTs) and single-walled (SWNTs) nanotubes opened up a wide horizon for applications of these nanostructures as electronic and structural materials. Later on, it has been realized that the nanotubular structures are formed in other layered compounds, e.g. in the B-C-N materials. However, in contrast to the C-based nanotubes whose synthesis parameters are well-established, synthesis of B- and N-doped C and pure BN nanotubes is a challenging issue. The present paper reports on large-scale synthesis and detailed HRTEM and EELS characterization of nanotubes in the B-C-N system.

MWNTs and SWNTs of B-C-N and BN were produced from C nanotube templates via a substitution chemical method through oxidation by B2O3, in a flowing N2 atmosphere at 1573- 1773 K. HRTEM of a product was carried out using a high-resolution field emission transmission electron microscope JEM-3000F (JEOL) equipped with a parallel EELS detector Gatan 666 and an ultra thin window Si(Li) EDS detector.

Type
Sir John Meurig Thomas Symposium: Microscopy and Microanalysis in the Chemical Sciences
Information
Microscopy and Microanalysis , Volume 6 , Issue S2: Proceedings: Microscopy & Microanalysis 2000, Microscopy Society of America 58th Annual Meeting, Microbeam Analysis Society 34th Annual Meeting, Microscopical Society of Canada/Societe de Microscopie de Canada 27th Annual Meeting, Philadelphia, Pennsylvania August 13-17, 2000 , August 2000 , pp. 50 - 51
Copyright
Copyright © Microscopy Society of America

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