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Movement and Imaging of Single-Atom Dopants in Silicon
Published online by Cambridge University Press: 04 August 2017
Abstract
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- Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1706 - 1707
- Copyright
- © Microscopy Society of America 2017
References
[6] Research sponsored by the Laboratory Directed Research and Development Program of Oak Ridge National Laboratory, managed by UT-Battelle, LLC, for the U. S. Department of Energy.Google Scholar
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