Hostname: page-component-586b7cd67f-2plfb Total loading time: 0 Render date: 2024-12-01T04:06:04.214Z Has data issue: false hasContentIssue false
  • English
  • Français

Morphological and Chemical Characterization of a Mechanically Alloyed Rubber Toughened PMMA With X-Ray Spectromicroscopy

Published online by Cambridge University Press:  02 July 2020

A. P. Smith ,
H. Ade ,
R. J. Spontak  and
C. C. Koch
A. P. Smith
Affiliation:
Departments of Materials Science and Engineering and North Carolina State University, Raleigh, NC, 27695
H. Ade
Affiliation:
Departments of Materials Science and Engineering and Physics, North Carolina State University, Raleigh, NC, 27695
R. J. Spontak
Affiliation:
Departments of Materials Science and Engineering and North Carolina State University, Raleigh, NC, 27695
C. C. Koch
Affiliation:
Departments of Materials Science and Engineering and North Carolina State University, Raleigh, NC, 27695
Get access

Extract

Rubber toughening was first developed about seventy years ago as a method of increasing the impact resistance of brittle glassy polymers. Since that time, a wide variety of techniques have been developed to produce discrete dispersions of rubber within a glassy polymer matrix. We are exploring a new route to rubber-toughen polymer through the non-equilibrium process of mechanical alloying (high-energy ball milling). Here we have blended poly(methyl methacrylate) (PMMA) with polyisoprene (PI) (see the insets in Fig. 1 for chemical structures) and have characterized the resultant blends with Scanning Transmission X-ray Microscopy (STXM) in order to obtain chemical, as well as morphological, information about the blends.

The STXM technique utilizes tuneable soft x-rays that are focused with a diffraction zoneplate to a microprobe of 45 nm full width at half maximum. Thin sections of the sample are placed at the microprobe and the transmitted photon intensity is measured.

Type
Compositional Mapping With High Spatial Resolution
Information
Microscopy and Microanalysis , Volume 4 , Issue S2: Proceedings: Microscopy & Microanalysis '98, Microscopy Society of America 56th Annual Meeting, Microbeam Analysis Society 32nd Annual Meeting, Atlanta, Georgia July 12-16, 1998 , July 1998 , pp. 142 - 143
Copyright
Copyright © Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)