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Monte Carlo Simulation of Solute-Atom Segregation at Grain Boundaries In Single-Phase Binary Face-Centered Cubic Alloys

Published online by Cambridge University Press:  02 July 2020

David N. Seidman ,
John D. Rittner  and
Dmitry Udler
David N. Seidman
Affiliation:
Department of Materials Science and Engineering, Northwestern University, 2225 N. Campus Drive, Evanston, Illinois, 60208-3108, U.S.A.
John D. Rittner
Affiliation:
Department of Materials Science and Engineering, Northwestern University, 2225 N. Campus Drive, Evanston, Illinois, 60208-3108, U.S.A.
Dmitry Udler
Affiliation:
Department of Materials Science and Engineering, Northwestern University, 2225 N. Campus Drive, Evanston, Illinois, 60208-3108, U.S.A.
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Extract

Solute-atom segregation to grain boundaries has been of interest since the 1930's when it was realized that some steels were susceptible to failure by intergranular fracture when certain impurities were present. Segregation of impurities or intentionally added alloying elements at grain boundaries can greatly affect various grain boundary properties, which in turn affect numerous macroscopic properties. Materials phenomena that have been linked to grain boundary segregation include temper brittleness, fatigue strength, adhesion, precipitation, diffusional creep, intergranular corrosion, and grain boundary diffusivity. Although grain boundary segregation has been extensively studied for many years, the effects of different grain boundary structures on segregation was generally not considered. It has been established both experimentally and theoretically that the level of segregation varies from grain boundary to grain boundary in the same alloy, but there is little direct information on how grain boundary structure influences segregation.

Type
Nanophase and Amorphous Materials
Information
Microscopy and Microanalysis , Volume 4 , Issue S2: Proceedings: Microscopy & Microanalysis '98, Microscopy Society of America 56th Annual Meeting, Microbeam Analysis Society 32nd Annual Meeting, Atlanta, Georgia July 12-16, 1998 , July 1998 , pp. 764 - 765
Copyright
Copyright © Microscopy Society of America

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