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Monolithic Multi-Grating Diffraction in a Convergent Electron Beam

Published online by Cambridge University Press:  25 July 2016

Akshay Agarwal
Affiliation:
Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, Massachusetts, USA
Chung-Soo Kim
Affiliation:
Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, Massachusetts, USA
Richard Hobbs
Affiliation:
Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, Massachusetts, USA
Dirk Van Dyck
Affiliation:
Department of Physics, University of Antwerp, Antwerp, Belgium
Karl K. Berggren
Affiliation:
Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, Massachusetts, USA

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Lichte, H & Lehmann, M Rep. Prog. Phy 71 (2008) 016102.CrossRefGoogle Scholar
[2] Dunin-Borkowski, R E, et al, Science 282 (1998). p. 18681870.Google Scholar
[3] Tonomura, A, et al, Phys. Rev. Lett. 56 (1986). p. 792.Google Scholar
[4] Sow, CH, et al, Phys. Rev. Lett 80 (1998). p. 2693.Google Scholar
[5] Marton, L, Simpson, JA & Suddeth, JA Phys. Rev 90 (1953). p. 490.Google Scholar
[6] Gronniger, G, et al, New Journal of Physics 8 (2006). p. 224.Google Scholar
[7] Houdellier, , et al, Ultramicroscopy 159 (2015). p. 5966.Google Scholar