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Monochromated EELS to Probe the Local Optical Properties of Low-Dimensional Materials

Published online by Cambridge University Press:  25 July 2016

Kazu Suenaga ,
Luiz H. G. Tizei ,
Yung-Chang Lin  and
Ryosuke Senga
Kazu Suenaga
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST), Central 5, 1-1-1 Higashi, Tsukuba, Ibaraki 305-8565, Japan
Luiz H. G. Tizei
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST), Central 5, 1-1-1 Higashi, Tsukuba, Ibaraki 305-8565, Japan Laboratoire de Physique des Solides, Universite Paris-Sud, Bat 510, Orsay 91405, France
Yung-Chang Lin
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST), Central 5, 1-1-1 Higashi, Tsukuba, Ibaraki 305-8565, Japan
Ryosuke Senga
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST), Central 5, 1-1-1 Higashi, Tsukuba, Ibaraki 305-8565, Japan

Abstract

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Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 950 - 951
Copyright
© Microscopy Society of America 2016 

References

[1] Mukai, M., et al., Ultramicroscopy 140 (2014) 37–43. (also in this conference).CrossRefGoogle Scholar
[2] Morishita, S., et al., Appl Phys. Lett. 108 (2016) 013107. (also in this conference).CrossRefGoogle Scholar
[3] Tizei, L., et al., Phys. Rev. Lett. 114 (2015) 107601.CrossRefGoogle Scholar
[4] Senga, R., et al., (unpublished).Google Scholar
[5] This work is supported by JST-CREST and Research Acceleration programs. The monochromated TEM/STEM was operated in the collaboration with JEOL and Gatan. We thank M. Mukai, S. Morishita, H. Sawada, D. Rinaldi and C. Trevor.Google Scholar