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Monitoring the Conductivity of Thin Metal Layers During the Processes of Grain-growth and Dewetting, Using a Desktop FEG-SEM

Published online by Cambridge University Press:  30 July 2020

AC Bouman ,
Jacob Jansen ,
M Griebling ,
L Lammers ,
VM Santos Costa ,
JJA Vermeulen ,
JGA Vervloat ,
AFJ Hammen  and
HW Zandbergen
AC Bouman
Affiliation:
Thermo Fisher Scientific, Eindhoven, Noord-Brabant, Netherlands
Jacob Jansen
Affiliation:
TU-Delft, Delft, Zuid-Holland, Netherlands
M Griebling
Affiliation:
TU-Delft, Delft, Zuid-Holland, Netherlands
L Lammers
Affiliation:
TU-Delft, Delft, Zuid-Holland, Netherlands
VM Santos Costa
Affiliation:
TU-Delft, Delft, Zuid-Holland, Netherlands
JJA Vermeulen
Affiliation:
TU-Delft, Delft, Zuid-Holland, Netherlands
JGA Vervloat
Affiliation:
TU-Delft, Delft, Zuid-Holland, Netherlands
AFJ Hammen
Affiliation:
Thermo Fisher Scientific, Eindhoven, Noord-Brabant, Netherlands
HW Zandbergen
Affiliation:
TU-Delft, Delft, Zuid-Holland, Netherlands

Abstract

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Type
Approaching Operando Imaging of Functional Materials
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1456 - 1457
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Copyright
Copyright © Microscopy Society of America 2020

References

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ASTM International, https://www.fushunspecialsteel.com/wp-content/uploads/2015/09/ASTM-E112-2010-Standard-Test-Methods-for-Determining-Average-Grain-Size.pdf, attached 19/02/2020.Google Scholar
Thompson, CV, Annual reviews of Materials Science 42 (2012), p. 399.10.1146/annurev-matsci-070511-155048CrossRefGoogle Scholar