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Modification of a Commercial Atomic Force Microscope for Nanorheological Experiments: Adsorbed Polymer Layers

Published online by Cambridge University Press:  08 August 2002

Shannon M. Notley ,
Vincent S. J. Craig  and
Simon Biggs
Shannon M. Notley
Affiliation:
Department of Chemistry, University of Newcastle, Callaghan, New South Wales, Australia
Vincent S. J. Craig
Affiliation:
Department of Applied Mathematics, Research School of Physical Sciences and Engineering, Australian National University, Canberra
Simon Biggs
Affiliation:
Department of Chemistry, University of Newcastle, Callaghan, New South Wales, Australia Department of Chemistry, University of Newcastle, Callaghan, New South Wales 2308, Australia
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Abstract

The atomic force microscope (AFM) has previously been applied to the measurement of surfaceforces (including adhesion and friction) and to the investigation of material properties, such as hardness. Herewe describe the modification of a commercial AFM that enables the stiffness of interaction between surfacesto be measured concurrently with the surface forces. The stiffness is described by the rheological phasedifference between the response of the AFM tip to a driving oscillation of the substrate. We present theinteraction between silica surfaces bearing adsorbed polymer, however, the principles could be applied to a widevariety of materials including biological samples.

Type
Scanning Probe Microscopy
Information
Microscopy and Microanalysis , Volume 6 , Issue 2 , March 2000 , pp. 121 - 128
Copyright
2000 Microscopy Society of America

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