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Misalignment Induced Artifacts in Quantitative Annular Bright-Field Imaging

Published online by Cambridge University Press:  25 July 2016

Peng Gao ,
Akihito Kumamoto ,
Ryo Ishikawa ,
Nathan Lugg ,
Naoya Shibata  and
Yuichi Ikuhara
Peng Gao
Affiliation:
Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Tokyo, Japan Electro Microscopy Laboratory, School of Physics, Center for Nanochemistry, and Collaborative Innovation Center for Quantum Matter, Peking University, Beijing, China
Akihito Kumamoto
Affiliation:
Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Tokyo, Japan
Ryo Ishikawa
Affiliation:
Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Tokyo, Japan
Nathan Lugg
Affiliation:
Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Tokyo, Japan
Naoya Shibata
Affiliation:
Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Tokyo, Japan
Yuichi Ikuhara
Affiliation:
Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Tokyo, Japan

Abstract

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Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 888 - 889
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Jia, C.L., et al, Nature Materials 6 (2007) 64.Google Scholar
[2] Nelson, C.T., et al, Nano Letters 11 (2011) 828.CrossRefGoogle Scholar
[3] Gao, P., et al, Nature Communications 4 (2013) 2791.Google Scholar
[4] Findlay, S., et al, Ultramicroscopy 110 (2010) 903.Google Scholar
[5] The authors gratefully acknowledge the financial support through a Grant-in-Aid for Scientific Research on Innovative Areas “Nano Informatics” (Grant No. 25106003) from Japan Society for the Promotion of Science (JSPS), and “Nanotechnology Platform” (Project No. 12024046) from the Ministry of Education, Culture, Sports, Science and Technology in Japan (MEXT).Google Scholar