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Microstructure Characterization of FePt/Ti/Si Thin Films

Published online by Cambridge University Press:  03 August 2008

Y Zhang ,
J Wan  and
GC Hadjipanayis
Y Zhang
Affiliation:
Massachusetts Institute of Technology
J Wan
Affiliation:
University of Delaware
GC Hadjipanayis
Affiliation:
University of Delaware
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 352 - 353
Copyright
© 2008 Microscopy Society of America

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