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Microstructural Properties and Defect Evolution on Nitride Compound Semiconductors Grown on Patterned Substrates: A Transmission Electron Microscopy Study

Published online by Cambridge University Press:  08 April 2017

Y Kim ,
Y Noh ,
S Han  and
M Kim
Y Kim
Affiliation:
Korea Research Institute of Standards and Science, Korea
Y Noh
Affiliation:
Wooree LST Corporation, Korea
S Han
Affiliation:
Chungnam University, Korea
M Kim
Affiliation:
Chungnam University, Korea

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 1456 - 1457
Copyright
Copyright © Microscopy Society of America 2011