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Microstructural Characterization of Closely-Lattice-Matched AlIn(Ga)N Alloys for High Electron Mobility Transistors

Published online by Cambridge University Press:  08 April 2017

L Zhou ,
L Kirste ,
T Lim ,
R Aidam ,
O Ambacher  and
D Smith
L Zhou
Affiliation:
Arizona State University
L Kirste
Affiliation:
Fraunhofer Institute for Applied Solid State Physics, Germany
T Lim
Affiliation:
Fraunhofer Institute for Applied Solid State Physics, Germany
R Aidam
Affiliation:
Fraunhofer Institute for Applied Solid State Physics, Germany
O Ambacher
Affiliation:
Fraunhofer Institute for Applied Solid State Physics, Germany
D Smith
Affiliation:
Arizona State University

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 1354 - 1355
Copyright
Copyright © Microscopy Society of America 2011