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Microstructural and Nanomechanical Characterization of In-Situ He Implanted and Irradiated fcc Materials

Published online by Cambridge University Press:  04 August 2017

P. Hosemann
Affiliation:
University of California at Berkeley, Department of Nuclear Engineering
D. Frazer
Affiliation:
University of California at Berkeley, Department of Nuclear Engineering
D. Kaoumi
Affiliation:
North Carolina State University, Department of Nuclear Engineering
C. Zheng
Affiliation:
North Carolina State University, Department of Nuclear Engineering

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2017 

References

[1] Kirk, M.A., et al, Micr. Res. Tech 72 2009). p. 182.Google Scholar
[2] Wang, Z., et al, Acta Mat 121 2016). p. 78.Google Scholar
[3] Reichardt, A., et al, J. Nucl. Mat 486 2017). p. 323.CrossRefGoogle Scholar
[4] The Authors want to than the IVEM microscope at Argonne National Laboratory as well as the Molecular Foundry which is supported by the Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231.Google Scholar