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Microstructural Analysis of Disordered and Ordered Mesoporous Silica Films

Published online by Cambridge University Press:  02 July 2020

C. A. Drewien ,
Y. Lu ,
C. J. Brinker ,
R. Ganguli  and
M. T. Anderson
C. A. Drewien
Affiliation:
Sandia National Laboratories, P.O. Box 5800, Albuquerque, NM87185-1405
Y. Lu
Affiliation:
University of New Mexico/NSF Center for Micro-Engineered Materials, The Advanced Materials Laboratory, 1001 University Blvd. SE, Albuquerque, NM87106
C. J. Brinker
Affiliation:
University of New Mexico/NSF Center for Micro-Engineered Materials, The Advanced Materials Laboratory, 1001 University Blvd. SE, Albuquerque, NM87106
R. Ganguli
Affiliation:
University of New Mexico/NSF Center for Micro-Engineered Materials, The Advanced Materials Laboratory, 1001 University Blvd. SE, Albuquerque, NM87106
M. T. Anderson
Affiliation:
now at 3M, Ceramic Technology Center, MS 201-4N-01, St. Paul, MN55144-100
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Extract

Processing can be controlled to produce a family of mesoporous silica films with either disordered, lamellar, hexagonal, or cubic pore distributions[l]. These films, formed by surfactant-templated synthesis and exhibiting a unimodal pore size, promise potential use as inorganic membranes, catalysts, and optically-based sensors[l,2]. The mesoporous films can be formed from initially homogeneous silica sols by a continuous, surfactant-templated process, which relies upon solvent evaporation during the sol-gel dip-coating process. Films of 100-500 nm thick are formed within seconds in a continuous coating operation. The microstructure of the films is dependent upon the cationic surfactant concentration CTAB (CH3(CH2)15N+(CH3)3Br-) and the dip-coating rate. Several films, processed under differing conditions, were investigated by TEM to characterize pore size, structure, and orientation.

Figures 1 a & b show the plan view and cross-sectional microstructure of a 2-d hexagonal mesoporous silica film deposited on silicon; the sample was calcined at 400 °C for 3 hours in air. The images were obtained on a Philips CM30 TEM, operated at 300 kV.

Type
Nanophase and Amorphous Materials
Information
Microscopy and Microanalysis , Volume 4 , Issue S2: Proceedings: Microscopy & Microanalysis '98, Microscopy Society of America 56th Annual Meeting, Microbeam Analysis Society 32nd Annual Meeting, Atlanta, Georgia July 12-16, 1998 , July 1998 , pp. 726 - 727
Copyright
Copyright © Microscopy Society of America

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References

1.Ganguli, R. et al., Nature, vol. 389, (1997) p. 364–368.Google Scholar
2.Ogawa, M., Chem. Comm., (1996) p. 1149–1150.CrossRefGoogle Scholar
3.Yang, H. et al., Nature, vol. 379, (1996) p. 703–705.CrossRefGoogle Scholar
4. This work was performed at Sandia National laboratories, which is operated for the U. S. Department of Energy under contract number DE-AC04-94AL85000.Google Scholar