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Micron-Scale Deformation: A Coupled In Situ Study of Strain Bursts and Acoustic Emission

Published online by Cambridge University Press:  17 October 2017

Ádám István Hegyi ,
Péter Dusán Ispánovity ,
Michal Knapek ,
Dániel Tüzes ,
Kristián Máthis ,
František Chmelík ,
Zoltán Dankházi ,
Gábor Varga  and
István Groma
Ádám István Hegyi
Affiliation:
Department of Materials Physics, Eötvös Loránd University, Pázmány Péter sétány 1/a, H-1117 Budapest, Hungary
Péter Dusán Ispánovity*
Affiliation:
Department of Materials Physics, Eötvös Loránd University, Pázmány Péter sétány 1/a, H-1117 Budapest, Hungary
Michal Knapek
Affiliation:
Faculty of Mathematics and Physics, Department of Physics of Materials, Charles University in Prague, Ke Karlovu 5, 121 16 Prague 2, Czech Republic
Dániel Tüzes
Affiliation:
Department of Materials Physics, Eötvös Loránd University, Pázmány Péter sétány 1/a, H-1117 Budapest, Hungary
Kristián Máthis
Affiliation:
Faculty of Mathematics and Physics, Department of Physics of Materials, Charles University in Prague, Ke Karlovu 5, 121 16 Prague 2, Czech Republic
František Chmelík
Affiliation:
Faculty of Mathematics and Physics, Department of Physics of Materials, Charles University in Prague, Ke Karlovu 5, 121 16 Prague 2, Czech Republic
Zoltán Dankházi
Affiliation:
Department of Materials Physics, Eötvös Loránd University, Pázmány Péter sétány 1/a, H-1117 Budapest, Hungary
Gábor Varga
Affiliation:
Department of Materials Physics, Eötvös Loránd University, Pázmány Péter sétány 1/a, H-1117 Budapest, Hungary
István Groma
Affiliation:
Department of Materials Physics, Eötvös Loránd University, Pázmány Péter sétány 1/a, H-1117 Budapest, Hungary
*
*Corresponding author. [email protected]
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Abstract

Plastic deformation of micron-scale crystalline materials differs considerably from bulk samples as it is characterized by stochastic strain bursts. To obtain a detailed picture of the intermittent deformation phenomena, numerous micron-sized specimens must be fabricated and tested. An improved focused ion beam fabrication method is proposed to prepare non-tapered micropillars with excellent control over their shape. Moreover, the fabrication time is less compared with other methods. The in situ compression device developed in our laboratory allows high-accuracy sample positioning and force/displacement measurements with high data sampling rates. The collective avalanche-like motion of the dislocations is observed as stress decreases on the stress–strain curves. An acoustic emission (AE) technique was employed for the first time to study the deformation behavior of micropillars. The AE technique provides important additional in situ information about the underlying processes during plastic deformation and is especially sensitive to the collective avalanche-like motion of the dislocations observed as the stress decreases on the deformation curves.

Keywords

micropillar compressionin situ deformationacoustic emissionmicrosample fabrication
Type
Materials Science Applications
Information
Microscopy and Microanalysis , Volume 23 , Issue 6 , December 2017 , pp. 1076 - 1081
Copyright
© Microscopy Society of America 2017 

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