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Micro X-ray Fluorescence of Particles Using a Laboratory X-ray Source and Capillary Optics

Published online by Cambridge University Press:  02 July 2020

J.R. Swider ,
T. Jach  and
E. Steel
J.R. Swider
Affiliation:
Surface and Microanalysis Science Division, Chemical Science and Technology Laboratory, National Institute of Standards and Technology, Gaithersburg, MD20899-8371
T. Jach
Affiliation:
Surface and Microanalysis Science Division, Chemical Science and Technology Laboratory, National Institute of Standards and Technology, Gaithersburg, MD20899-8371
E. Steel
Affiliation:
Surface and Microanalysis Science Division, Chemical Science and Technology Laboratory, National Institute of Standards and Technology, Gaithersburg, MD20899-8371
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Extract

Micro X-ray fluorescence (micro-XRF) is a useful nondestructive technique for multielement analysis of samples from a few hundred to a few micrometers in size. Micro-XRF is usually performed at synchrotron sources where element sensitivities are not compromised by micrometer spatial collimation of high flux beams. Ideally, micro-XRF would not have the burden of transporting samples to a synchrotron facility, but could be performed on a laboratory or portable scale. At the National Institute of Standards and Technology we are developing a micro-XRF system that combines a polycapillary optic with a standalone X-ray tube. This optic not only transmits the X-ray beam over 80 mm, but also focuses the beam to an area smaller than the unfocused beam size. The fine resolution combined with a high intensity produces a tool for laboratory scale micro-XRF analyses.

The X-ray focusing optic is a tapered, glass polycapillary optic. This optic, contained in an approximately 5 × 70 mm steel cylinder, transmits and focuses incoming X-rays to a spot 9.5 mm from the optic exit.

Type
Advances in Instrumentation
Information
Microscopy and Microanalysis , Volume 5 , Issue S2: Proceedings: Microscopy & Microanalysis '99, Microscopy Society of America 57th Annual Meeting, Microbeam Analysis Society 33rd Annual Meeting, Portland, Oregon August 1-5, 1999 , August 1999 , pp. 354 - 355
Copyright
Copyright © Microscopy Society of America

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References

1.Adams, F.et al., Journal of Analytical Atomic Spectroscopy 13 (1998) 339.Google Scholar
2.Torok, Sz.et al., X-Ray Spectrometry 23(1994) 3.CrossRefGoogle Scholar
3.Ice, G.E., X-ray Spectrometry 26 (1994) 315.3.0.CO;2-N>CrossRefGoogle Scholar
4.Gormley, J.et al., Advances in X-Ray Analysis (in press).Google Scholar