Hostname: page-component-5f745c7db-tvc9f Total loading time: 0 Render date: 2025-01-07T01:04:07.598Z Has data issue: true hasContentIssue false
  • English
  • Français

Methods for Scanning Transmission Electron Microscopy High Angle Annular Dark Field Based for Three Dimensional Analysis of the Local Composition in Solid Alloys

Published online by Cambridge University Press:  27 August 2014

E. Rotunno ,
V. Grillo ,
T. Markurt ,
T. Remmele  and
M. Albrecht
E. Rotunno
Affiliation:
CNR-IMEM, Parco delle Scienze 37a, I-43100 Parma, Italy. (12pt)
V. Grillo
Affiliation:
CNR-Istituto Nanoscienze, Centro S3, Via G Campi 213/a, I-41125 Modena, Italy
T. Markurt
Affiliation:
Leibniz Institute for Crystal Growth, Max-Born-Strasse 2, 12489 Berlin, Germany
T. Remmele
Affiliation:
Leibniz Institute for Crystal Growth, Max-Born-Strasse 2, 12489 Berlin, Germany
M. Albrecht
Affiliation:
Leibniz Institute for Crystal Growth, Max-Born-Strasse 2, 12489 Berlin, Germany

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 594 - 595
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Voyles, P.M., Grazul, J.L., Muller, D.A. Ultramicroscopy 96 (2003) 251–273.Google Scholar
[2] Carlino, E., Grillo, V. Physical Review B 71 (2005) 235303.Google Scholar
[3] Benthem, K.v., Lupini, A.R., Kim, M., et al., Appl. Phys. Lett. 87, 034104 (2005).Google Scholar
[4] Peng, Y., Nellist, P. D.and Pennycook, S. J. Journal of Electron Microscopy 53 (2004)257.Google Scholar