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Method of Calculating True Particle Size Distributions from Observed Sizes in a Thin Section

Published online by Cambridge University Press:  28 July 2005

E. Bruce Nauman  and
Timothy J. Cavanaugh
E. Bruce Nauman
Affiliation:
The Isermann Department of Chemical Engineering, Ricketts Building, Rensselaer Polytechnic Institute, Troy, NY 12180-3590
Timothy J. Cavanaugh
Affiliation:
The Isermann Department of Chemical Engineering, Ricketts Building, Rensselaer Polytechnic Institute, Troy, NY 12180-3590
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Abstract

Particle size distributions obtained from a thin section are usually a skewed version of the true distribution. A previous method for determining the parent distribution was questionable because negative particle frequencies could be obtained. Here, we describe a method of determining parent distributions of spherical particles using a model with adjustable parameters. Our calculated distributions are somewhat broader than the distributions obtained with previous methods, but the average particle sizes are nearly identical. The newly developed model is applicable to any type of transmission microscopy.

Keywords

particle size distributionaverage particle sizemodelpolymer blend
Type
Research Article
Information
Microscopy and Microanalysis , Volume 4 , Issue 2 , April 1998 , pp. 122 - 127
Copyright
© 2005 Microscopy Society of America

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