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Method for Estimating the Charge Density Distribution on a Dielectric Surface

Published online by Cambridge University Press:  12 April 2017

Takuya Nakashima ,
Hiroyuki Suhara ,
Hidekazu Murata  and
Hiroshi Shimoyama
Takuya Nakashima
Affiliation:
Faculty of Science and Technology, Meijo University, Tempaku-ku, Nagoya 468-8502, Japan
Hiroyuki Suhara
Affiliation:
RICOH Co., Ltd., 810, Shimo-imaizumi, Ebina-shi, Kanagawa 243-0460, Japan
Hidekazu Murata*
Affiliation:
Faculty of Science and Technology, Meijo University, Tempaku-ku, Nagoya 468-8502, Japan
Hiroshi Shimoyama
Affiliation:
Faculty of Science and Technology, Meijo University, Tempaku-ku, Nagoya 468-8502, Japan
*
*Corresponding author. [email protected]
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Abstract

High-quality color output from digital photocopiers and laser printers is in strong demand, motivating attempts to achieve fine dot reproducibility and stability. The resolution of a digital photocopier depends on the charge density distribution on the organic photoconductor surface; however, directly measuring the charge density distribution is impossible. In this study, we propose a new electron optical instrument that can rapidly measure the electrostatic latent image on an organic photoconductor surface, which is a dielectric surface, as well as a novel method to quantitatively estimate the charge density distribution on a dielectric surface by combining experimental data obtained from the apparatus via a computer simulation. In the computer simulation, an improved three-dimensional boundary charge density method (BCM) is used for electric field analysis in the vicinity of the dielectric material with a charge density distribution. This method enables us to estimate the profile and quantity of the charge density distribution on a dielectric surface with a resolution of the order of microns. Furthermore, the surface potential on the dielectric surface can be immediately calculated using the obtained charge density. This method enables the relation between the charge pattern on the organic photoconductor surface and toner particle behavior to be studied; an understanding regarding the same may lead to the development of a new generation of higher resolution photocopiers.

Keywords

Electrostatic latent imageboundary charge methodscanning electron microscopycharge density distributionorganic photoconductor
Type
Materials Science Applications
Information
Microscopy and Microanalysis , Volume 23 , Issue 3 , June 2017 , pp. 472 - 483
Copyright
© Microscopy Society of America 2017 

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References

1. Drelich, J. & Wang, Y.U. (2015). Charge heterogeneity of surfaces: Mapping and effects on surface forces. Adv Colloid Interface Sci 165, 91–101.Google Scholar
2. Fritz, G.F., Hoestery, D.C. & Brady, L.E. (1971). Observation of xerographic electrostatic latent images with a scanning electron microscope. Appl Phys Lett 19, 277–278.CrossRefGoogle Scholar
3. Geuzaine, C. & Remacle, J. (2009). Gmsh: A 3-D finite element mesh generator with built-in pre- and post-processing facilities. Int J Numer Met Eng 79, 1309–1331.Google Scholar
4. Ishitani, T., Kawanami, Y. & Todokoro, H. (1985). Aluminum-line cutting end-monitor utilizing scanning-ion-microscope voltage-contrast Images. Jpn J of Appl Phys 24, 133–134.Google Scholar
5. Kotera, M., Osada, A., Otani, M. & Ohara, Y. (2011). Measurement of surface potential of insulating film on a conductive substrate in a scanning electron microscope specimen chamber. J Vac Sci Technol B 29, 06F316.Google Scholar
6. Liu, J., Gaikwad, R., Hande, A., Das, S. & Thundat, T. (2015). Mapping and quantifying surface charges on clay nanoparticles. Langmuir 31, 10469–10476.Google Scholar
7. Martin, Y., Williams, C.C. & Wickramasinghe, H.K. (1987). Atomic force microscope–force mapping and profiling on a sub 100-Å scale. J Appl Phys 61, 4723–4729.Google Scholar
8. Murata, H., Ohye, T. & Shimoyama, H. (1996). Improved 3-D boundary charge method. Proc SPIE 2858, 103–114.Google Scholar
9. Murata, H., Ohye, T. & Shimoyama, H. (1997). Improved 3-D boundary charge method for high-accuracy electric field calculation. Proc SPIE 3155, 113–124.Google Scholar
10. Murata, H., Ohye, T. & Shimoyama, H. (2001). Improved 3D boundary charge method for high-accuracy calculation of potential and electric field in composite dielectric system. Proc SPIE 4510, 107–118.Google Scholar
11. Murata, H., Ohye, T. & Shimoyama, H. (2004). High accuracy calculation of electric field in composite dielectric system by improved 3-D boundary charge method. Nucl Instrum Methods A 519, 184–195.Google Scholar
12. Ose, Y., Ezumi, M. & Todokoro, H. (1999). Improved CD-SEM optics with retarding and boosting electric fields. Proc SPIE 3677, 930–939.Google Scholar
13. Read, F.H. & Bowring, N.J. (2004). Simulation of thermionic cathodes. Nucl Instrum Methods A 531, 407–415.Google Scholar
14. Read, F.H. & Bowring, N.J. (2011). The CPO programs and the BEM for charged particle optics. Nucl Instrum Methods A 645, 273–277.Google Scholar
15. Suhara, H. (2013). High-resolution measurement of electrostatic latent image formed on photoconductor using electron beam probe. Journal of the Imaging Society of Japan 52, 501–508.Google Scholar
16. Suhara, H., Ueda, T. & Tanaka, H. (2013). Potential profile measurement and mechanism analysis of an electrostatic latent image by detecting primary electrons. J Imaging Sci Technol 57, 060502-1–060502-7.Google Scholar
17. Takahashi, J. & Katoh, T. (1997). High voltage and high resolution surface potential imaging using scanning electrostatic force microscope. IEEJ Transactions on Sensors and Micromachines 117–E, 594–599.Google Scholar
18. Tani, M., Uehara, T., Nakagawa, K. & Itoh, A. (1997). An analysis of electrostatic force and designing/manufacturing of a detector with cantilever for electrostatic force microscope. IS&T’s NIP13: International Conference on Digital Printing Technologies, Seattle, WA, USA, pp. 284–288.Google Scholar
19. Uehara, T., Higashio, J., Ashizawa, Y., Aizawa, K., Nakagawa, K. & Itoh, A. (2009). Real time observation of surface potential distribution with an EFM on CTL. IS&T’s NIP25: International Conference on Digital Printing Technologies and Digital Fabrication, Louisville, KY, USA, pp. 212–215.Google Scholar
20. Ura, K. (1998). Contrast mechanism of negatively charged insulators in scanning electron microscope. J Electron Microsc 47, 143–147.Google Scholar
21. Yarmchuk, E.J. & Keefe, A.G.E. (1989). High-resolution surface charge measurements on an organic photoconductor. J Appl Phys 66, 5435–5439.Google Scholar
22. Zhu, X. & Munro, E. (1989). A computer program for electron gun design using second-order finite elements. J Vac Sci Technol B 7, 1862–1869.Google Scholar
23. Zhu, X. & Munro, E. (1995). Second-order finite element method and its practical application in charged particle optics. J Microsc 179, 170–180.Google Scholar