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Measuring the Thickness of 2D Materials Using EDS

Published online by Cambridge University Press:  30 July 2020

Samuel Marks ,
Philippe Pinard ,
Simon Burgess ,
Jo Bithell  and
Richard Beanland
Samuel Marks
Affiliation:
Oxford Instruments, High Wycombe, England, United Kingdom
Philippe Pinard
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, England, United Kingdom
Simon Burgess
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, England, United Kingdom
Jo Bithell
Affiliation:
University of Warwick, Coventry, England, United Kingdom
Richard Beanland
Affiliation:
University of Warwick, Coventry, England, United Kingdom

Abstract

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Type
Pushing the Limits of Detection in Quantitative (S)TEM Imaging, EELS, and EDX
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1212 - 1214
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Copyright
Copyright © Microscopy Society of America 2020

References

Geim, A K, Science 324.5934 (2009): 1530–1534.10.1126/science.1158877CrossRefGoogle Scholar
Bianco, A et al. , Carbon (2013): 1–6.10.1016/j.carbon.2013.08.038CrossRefGoogle Scholar
Cliff, G and Lorimer, GW, Journal of Microscopy 103 (1975), 203–20710.1111/j.1365-2818.1975.tb03895.xCrossRefGoogle Scholar
Watanabe, M and Williams, DB, Journal of Microscopy 221 (2006), 89–10910.1111/j.1365-2818.2006.01549.xCrossRefGoogle Scholar
Statham, P, et al. IOP Conf. Ser.: Mater. Sci. Eng. 304 (2017), 01201710.1088/1757-899X/304/1/012017CrossRefGoogle Scholar