Measuring Lattice Parameters and Local Rotation using Convergent Beam Electron Diffraction: One Step Further

Y. Martin; J.-M. Zuo; V. Favre-Nicolin; J.-L. Rouvière

doi:10.1017/S1431927613005540

Measuring Lattice Parameters and Local Rotation using Convergent Beam Electron Diffraction: One Step Further

Published online by Cambridge University Press: 09 October 2013

Y. Martin ,

J.-M. Zuo ,

V. Favre-Nicolin and

J.-L. Rouvière

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Y. Martin: Affiliation:
J.-M. Zuo: Affiliation:
V. Favre-Nicolin: Affiliation:
J.-L. Rouvière: Affiliation:

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Abstract

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type: Abstract
Information: Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 710 - 711

DOI: https://doi.org/10.1017/S1431927613005540 [Opens in a new window]

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Measuring Lattice Parameters and Local Rotation using Convergent Beam Electron Diffraction: One Step Further

Abstract

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