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Measuring Interface Potential of Bi2sr2cacu2O8 (001) Twist Boundaries by off-Axis Electron Holography

Published online by Cambridge University Press:  02 July 2020

M. A. Schofield  and
Y. Zhu
M. A. Schofield
Affiliation:
Materials Science Division, Brookhaven National Laboratory, Upton, NY, 11973
Y. Zhu
Affiliation:
Materials Science Division, Brookhaven National Laboratory, Upton, NY, 11973
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Abstract

The potential variation, charge transfer and lattice distortion across grain boundaries in polycrystalline superconductors play a crucial role in the transport properties of the material. in particular, the grain interfaces often act as weak links to the superconducting current, which limits the critical current densities that may be obtained. in the case of the high Tc superconductor Bi2Sr2CaCu2O8 (Bi-2212), special interest is paid to (001) twist boundaries since, in part, they are dominant in c-axis aligned tapes and wires, but more interestingly because the superconducting critical current is found to be independent of twist angle for this system. Such grain boundary behavior is presently not understood, and is further puzzling since “impurity phases” of Bi-2223 or Bi-2201 (consisting of additional or missing Cu-Ca-0 planes, respectively) are commonly observed at the (001) twist boundaries. with the rich structure found at these types if interfaces, understanding the potential distribution may lead to new insight about the boundary properties.

Type
Quantitative Transmission Electron Microscopy of Interfaces (Organized by M. Rüehle, Y. Zhu and U. Dahmen)
Information
Microscopy and Microanalysis , Volume 7 , Issue S2: Proceedings: Microscopy & Microanalysis 2001, Microscopy Society of America 59th Annual Meeting, Microbeam Analysis Society 35th Annual Meeting, Long Beach, California August 5-9, 2001 , August 2001 , pp. 294 - 295
Copyright
Copyright © Microscopy Society of America 2001

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References

1.Li, Q. et al., Physica C, 282-287 (1997) 1495.Google Scholar
2.See for review, Volkl, E. et al., Eds., Introduction to Electron Holography, New York Plenum (1999).CrossRefGoogle Scholar
3.Wu, L. et al., in this Microscopy and Microanalysis Proceedings (2001).Google Scholar
4.This work was supported under US DOE contract No. DE-AC02-98CH10886.Google Scholar