Hostname: page-component-cd9895bd7-8ctnn Total loading time: 0 Render date: 2024-12-28T06:08:50.017Z Has data issue: false hasContentIssue false
  • English
  • Français

Measuring Dynamics in Energy Materials Using Functional Atomic Force Microscopy

Published online by Cambridge University Press:  22 July 2022

R. Giridharagopal  and
D. S. Ginger
R. Giridharagopal*
Affiliation:
University of Washington, Department of Chemistry, Seattle, Washington, USA
D. S. Ginger
Affiliation:
University of Washington, Department of Chemistry, Seattle, Washington, USA
*
*Corresponding author: [email protected]

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 904 - 905
Check for updates
Copyright
Copyright © Microscopy Society of America 2022

References

Giridharagopal, R., Cox, P. A., and Ginger, D. S.. Acc. Chem. Res. 49, 1769 (2016). DOI: 10.1021/acs.accounts.6b00255CrossRefGoogle Scholar
Giridharagopal, R., et al. Nano Lett. 12, 893 (2012). DOI: 10.1021/nl203956qCrossRefGoogle Scholar
Karatay, D. U., Harrison, J. S., Glaz, M. S., Giridharagopal, R., and Ginger, D. S.. Rev. Sci. Instrum. 87, 053702 (2016). DOI: 10.1063/1.4948396CrossRefGoogle Scholar
Giridharagopal, R., et al. ACS Nano 13, 2812 (2019). DOI: 10.1021/acsnano.8b08390CrossRefGoogle Scholar
Tirmzi, A. M., Dwyer, R. P., Jiang, F., and Marohn, J. A.. J. Phys. Chem. C 124, 13639 (2020). DOI: 10.1021/acs.jpcc.0c04467CrossRefGoogle Scholar
Shea, D. E., Giridharagopal, R., Ginger, D. S., Brunton, S. L., and Kutz, J. N., IEEE Access 9, 83453 (2021). DOI: 10.1109/ACCESS.2021.3087595CrossRefGoogle Scholar
The authors acknowledge funding from the DOE and NSF for supporting this work.Google Scholar