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Measuring Antiferromagnetism at the Angstrom Scale using 4D-STEM

Published online by Cambridge University Press:  22 July 2022

Jeffrey Huang
Affiliation:
Department of Materials Science and Engineering, University of Illinois at Urbana-Champaign, Urbana, IL, United States
Kayla Nguyen
Affiliation:
Department of Materials Science and Engineering, University of Illinois at Urbana-Champaign, Urbana, IL, United States
Manohar Karigerasi
Affiliation:
Department of Materials Science and Engineering, University of Illinois at Urbana-Champaign, Urbana, IL, United States
Kisung Kang
Affiliation:
Department of Materials Science and Engineering, University of Illinois at Urbana-Champaign, Urbana, IL, United States
André Schleife
Affiliation:
Department of Materials Science and Engineering, University of Illinois at Urbana-Champaign, Urbana, IL, United States
Daniel Shoemaker
Affiliation:
Department of Materials Science and Engineering, University of Illinois at Urbana-Champaign, Urbana, IL, United States
David Cahill
Affiliation:
Department of Materials Science and Engineering, University of Illinois at Urbana-Champaign, Urbana, IL, United States
Jian-Min Zuo
Affiliation:
Department of Materials Science and Engineering, University of Illinois at Urbana-Champaign, Urbana, IL, United States
Pinshane Huang
Affiliation:
Department of Materials Science and Engineering, University of Illinois at Urbana-Champaign, Urbana, IL, United States

Abstract

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Type
Developments of 4D-STEM Imaging - Enabling New Materials Applications
Copyright
Copyright © Microscopy Society of America 2022

References

Fukami, S, Lorenz, VO and Gomonay, O, J. Appl. Phys. 128 (2020), p. 126129. doi:10.1063/5.0023614CrossRefGoogle Scholar
McGrouther, D. et al. , New J. Phys. 18 (2016), p. 095004. doi:10.1088/1367-2630/18/9/095004CrossRefGoogle Scholar
Kohno, Y et al. , Nature. 602 (2022), p. 234239. doi: 10.1038/s41586-021-04254-zCrossRefGoogle Scholar
Shull, CG, Strauser, WA and Wollan, EO, Phys. Rev. 83 (1951), p. 333345. doi:10.1103/PhysRev.83.333CrossRefGoogle Scholar
Loudon, JC, Phys. Rev. Lett. 109 (2012), p. 15. doi:10.1103/PhysRevLett.109.267204CrossRefGoogle Scholar
Nellist, PD, McCallum, BC and Rodenburg, JM, Nature 374 (1995), p. 630632. doi:10.1038/374630a0CrossRefGoogle Scholar
Edström, A, Lubk, A and Rusz, J, Phys. Rev. B 99 (2019), p. 19. doi:10.1103/PhysRevB.99.174428CrossRefGoogle Scholar
This work was supported by AFOSR grant number AF FA9550-20-1-0302 and NSF-MRSEC award number DMR-1720633. Experiments were carried out in the Cornell Center for Materials Research Shared Facilities (supported through the NSF MRSEC program (DMR-1719875)) and in the Materials Research Laboratory Central Research Facilities at the University of Illinois.Google Scholar