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Measurements of GaN-Based Heterostructures with Electron Beam Induced Current

Published online by Cambridge University Press:  01 August 2002

K.L. Bunker ,
J.C. Gonzalez ,
A.D. Batchelor  and
P.E. Russell
K.L. Bunker
Affiliation:
Materials Science and Engineering Department and Analytical Instrumentation Facility, North Carolina State University, Box 7531, Raleigh, NC 27695
J.C. Gonzalez
Affiliation:
Materials Science and Engineering Department and Analytical Instrumentation Facility, North Carolina State University, Box 7531, Raleigh, NC 27695
A.D. Batchelor
Affiliation:
Materials Science and Engineering Department and Analytical Instrumentation Facility, North Carolina State University, Box 7531, Raleigh, NC 27695
P.E. Russell
Affiliation:
Materials Science and Engineering Department and Analytical Instrumentation Facility, North Carolina State University, Box 7531, Raleigh, NC 27695

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 1208 - 1209
Copyright
Copyright © Microscopy Society of America 2002