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Measurement of X-ray Emission Efficiency for K-lines

Published online by Cambridge University Press:  01 August 2004

M. Procop
M. Procop
Affiliation:
Bundesanstalt fuer Materialforschung und -pruefung (BAM), D-12200 Berlin, Germany
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Abstract

Results for the X-ray emission efficiency (counts per C per sr) of K-lines for selected elements (C, Al, Si, Ti, Cu, Ge) and for the first time also for compounds and alloys (SiC, GaP, AlCu, TiAlC) are presented. An energy dispersive X-ray spectrometer (EDS) of known detection efficiency (counts per photon) has been used to record the spectra at a takeoff angle of 25° determined by the geometry of the secondary electron microscope's specimen chamber. Overall uncertainty in measurement could be reduced to 5 to 10% in dependence on the line intensity and energy. Measured emission efficiencies have been compared with calculated efficiencies based on models applied in standardless analysis. The widespread XPP and PROZA models give somewhat too low emission efficiencies. The best agreement between measured and calculated efficiencies could be achieved by replacing in the modular PROZA96 model the original expression for the ionization cross section by the formula given by Casnati et al. (1982) A discrepancy remains for carbon, probably due to the high overvoltage ratio.

Keywords

X-ray spectrometryX-ray emissionX-ray yieldelectron probe microanalysisEPMAstandardless analysis
Type
Microanalysis
Information
Microscopy and Microanalysis , Volume 10 , Issue 4 , August 2004 , pp. 481 - 490
Copyright
© 2004 Microscopy Society of America

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