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Maximising Information from Aberration-Corrected STEM images: Applications to Plasmonic, Semiconductor and Battery Materials

Published online by Cambridge University Press:  23 September 2015

Y Zhu ,
H Katz-Boon ,
CL Zheng ,
M Walsh ,
C Dwyer ,
L Bourgeois ,
R Withers  and
J Etheridge
Y Zhu
Affiliation:
Monash Centre for Electron Microscopy, Monash University, Victoria 3800, Australia Department of Materials Engineering, Monash University, Victoria 3800, Australia
H Katz-Boon
Affiliation:
Department of Materials Engineering, Monash University, Victoria 3800, Australia
CL Zheng
Affiliation:
Monash Centre for Electron Microscopy, Monash University, Victoria 3800, Australia
M Walsh
Affiliation:
Department of Materials Engineering, Monash University, Victoria 3800, Australia
C Dwyer
Affiliation:
Ernst Ruska-Centre, Peter Gruenberg Inst, Forschungszentrum Juelich, D-52425 Juelich, Germany
L Bourgeois
Affiliation:
Monash Centre for Electron Microscopy, Monash University, Victoria 3800, Australia
R Withers
Affiliation:
Research School of Chemistry, Australian National University, ACT 0200, Australia
J Etheridge
Affiliation:
Monash Centre for Electron Microscopy, Monash University, Victoria 3800, Australia Department of Materials Engineering, Monash University, Victoria 3800, Australia

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 2415 - 2416
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

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[2] Dwyer, C, Maunders, C, Zheng, C L, Weyland, M, Tiemeijer, P & Etheridge, J., App Phys Lett 100 (2012).Google Scholar
[3] Zheng, C L & Etheridge, J, Ultramicroscopy 125 (2013) 49.CrossRefGoogle Scholar
[4] Katz-Boon, H, et al., Nano Letts just accepted (2015). DOI: 10.1021/acs.nanolett.5b00124.Google Scholar
[5] Erni, R, et al. Nat. Mater. 13 (2014) 216 ; B Guiton & P Davies Nat. Mater. 13 (2014) 217.Google Scholar
[6] Zhu, Y, Withers, R, Bourgeois, L, Dwyer, C & Etheridge, J submitted 2015.Google Scholar
[7] Kauko, H, Zheng, CL, Zhu, Y, et al., App Phys Letts 103 (2013) 232111.Google Scholar
[8] Jiang, N, Gao, Q, Parkinson, P, Wong-Leung, J, et al., Nano Lett 13 (2013) 5135.Google Scholar
[9] Funding is acknowledged from the Australian Research Council Grants DP110104734, DP120101573, LE0454166. We thank A. Funston, P. Mulvaney and C. Jagadish for specimens.Google Scholar