Hostname: page-component-cd9895bd7-dk4vv Total loading time: 0 Render date: 2024-12-26T09:30:47.070Z Has data issue: false hasContentIssue false
  • English
  • Français

A Materials Scientist's CANVAS: A System for Controlled Alteration of Nanomaterials in Vacuum Down to the Atomic Scale

Published online by Cambridge University Press:  22 July 2022

Clemens Mangler ,
Jannik Meyer ,
Andreas Mittelberger ,
Kimmo Mustonen ,
Toma Susi  and
Jani Kotakoski
Clemens Mangler*
Affiliation:
University of Vienna, Faculty of Physics, Vienna, Austria
Jannik Meyer
Affiliation:
University of Vienna, Faculty of Physics, Vienna, Austria Current affiliation: University of Tuebingen, Institute for Applied Physics, Tuebingen, Germany
Andreas Mittelberger
Affiliation:
University of Vienna, Faculty of Physics, Vienna, Austria Current affiliation: Nion Co., Kirkland, WA, USA
Kimmo Mustonen
Affiliation:
University of Vienna, Faculty of Physics, Vienna, Austria
Toma Susi
Affiliation:
University of Vienna, Faculty of Physics, Vienna, Austria
Jani Kotakoski
Affiliation:
University of Vienna, Faculty of Physics, Vienna, Austria
*
*Corresponding author: [email protected]

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Microscopy Infrastructures: Architectures, Avenues and Access
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2940 - 2942
Check for updates
Copyright
Copyright © Microscopy Society of America 2022

References

Hotz, MT et al., Microscopy and Microanalysis 22(S3) (2016), p. 34. doi:10.1017/S1431927616001021CrossRefGoogle Scholar
Krivanek, OL et al. , Ultramicroscopy 108(3) (2008), p. 179. doi:10.1016/j.ultramic.2007.07.010CrossRefGoogle Scholar
GETec Microscopy, https://www.getec-afm.com/afsem/ (accessed Feb. 18, 2022)Google Scholar
SPECS, https://www.specs-group.com/nc/specs/products/detail/mps-ecr-an/ (accessed Feb. 18, 2022)Google Scholar
Riber products, https://www.riber.com/product/s40-st-hl-cl-dz-series/ (accessed Feb. 18, 2022)Google Scholar
FOCUS EFM3, https://www.focus-gmbh.com/efm-evaporators/efm-3/ (accessed Feb. 18, 2022)Google Scholar
Lastertack, https://lasertack.com/en/6w-445nm-laser-diode-nubm44 (accessed Feb. 18, 2022)Google Scholar
MBRAUN Glovebox Workstations, https://www.mbraun.com/en/products/glovebox-workstations.html (accessed Feb. 18, 2022)Google Scholar
Inani, H et al. , The Journal of Physical Chemistry C 123(20) (2019), p. 13136. doi:10.1021/acs.jpcc.9b01894bCrossRefGoogle Scholar
Trentino, A et al. , Nano Letters 21(12) (2021), p. 5179. doi:10.1021/acs.nanolett.1c01214CrossRefGoogle Scholar
Leuthner, GT et al. , 2D Materials 8(3) (2021), p. 035023. doi:10.1088/2053-1583/abf624CrossRefGoogle Scholar
Mustonen, K et al. , Advanced Materials (2022), p. 2106922. doi:10.1002/adma.202106922CrossRefGoogle Scholar
Hofer, C et al. , Nature Communications 10 ( 2019), p. 4570. doi:10.1038/s41467-019-12537-3CrossRefGoogle Scholar
Zagler, G et al. , 2D Materials 7(4) (2020), p. 045017. doi:10.1088/2053-1583/ab9c39CrossRefGoogle Scholar
The authors thank V Skákalová for suggesting the name of the system, G Zagler, S Hummel, W Joudi and F Herterich for help with construction. This work was supported by the European Research Council (ERC) Grant No. 336453-PICOMAT. J.K. acknowledges support from the Austrian Science Fund (FWF) through projects I3181-N36 and P31605-N36, and T.S. through project P28322-N36 as well as through the European Research Council (ERC) Grant no. 756277-ATMEN.Google Scholar