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Materials Science Applications of Aberration Corrected TEM and/or STEM

Published online by Cambridge University Press:  23 September 2015

Gustaaf Van Tendeloo ,
Artem Abakumov ,
Sara Bals ,
Sandra Van Aert  and
Jo Verbeeck
Gustaaf Van Tendeloo
Affiliation:
EMAT Research Group, Department of Physics, University of Antwerp, B-2020, Belgium
Artem Abakumov
Affiliation:
EMAT Research Group, Department of Physics, University of Antwerp, B-2020, Belgium
Sara Bals
Affiliation:
EMAT Research Group, Department of Physics, University of Antwerp, B-2020, Belgium
Sandra Van Aert
Affiliation:
EMAT Research Group, Department of Physics, University of Antwerp, B-2020, Belgium
Jo Verbeeck
Affiliation:
EMAT Research Group, Department of Physics, University of Antwerp, B-2020, Belgium

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1131 - 1132
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Sathiya, M., et al., Nature Materials (2014). DOI: 10.1038/NMAT4137.CrossRefGoogle Scholar
[2] Goris, B., et al., ACS Nano 8 (2014). p 10878.Google Scholar
[3] Tan, H., et al., Angew. Chem. Int. Ed 52 (2013). p 11360.Google Scholar