Hostname: page-component-586b7cd67f-g8jcs Total loading time: 0 Render date: 2024-11-26T12:41:02.300Z Has data issue: false hasContentIssue false
  • English
  • Français

Mass-Thickness Measurements in the TEM via EDS: A New Approach to Quantitative Chemical Analysis of Planetary Materials?

Published online by Cambridge University Press:  01 August 2018

Thomas J. Zega ,
Jane Y. Howe ,
James Sagar ,
Philippe Pinard  and
Rachel Koch
Thomas J. Zega
Affiliation:
Lunar and Planetary Laboratory, University of Arizona, Tucson, USA. Materials Science and Engineering, University of Arizona, Tucson, USA.
Jane Y. Howe
Affiliation:
Hitachi High-Technologies America Inc., Clarksburg, USA.
James Sagar
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, UK.
Philippe Pinard
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, UK.
Rachel Koch
Affiliation:
Hitachi High-Technologies America Inc., Clarksburg, USA.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 2084 - 2085
Copyright
© Microscopy Society of America 2018 

References

[1] Watanabe, S, et al, Space Sci Rev 208 2017) p. 3.Google Scholar
[2] Lauretta, DS, et al, Space Sci Rev 2017) p. 925.Google Scholar
[3] Squyres, SW, et al Lunar & Planet Sci Conf (2018) Abstract #1332.Google Scholar
[4] Cliff, G Lorimer, GW Journal of Microscopy 103 1975) p. 203.Google Scholar
[5] Watanabe, M Williams, DB Journal of Microscopy 221 2006) p. 89.Google Scholar
[6] Statham, P, et al, IOP Conf. Ser.: Mater. Sci. Eng. 304 2017 012017.Google Scholar
[7] Zega, TJ, et al, Meteoritics & Planet. Sci. 42 2007) p. 1373.Google Scholar
[8] We gratefully acknowledge NASA (grants #NNX12AL47G and #NNX15AJ22G) and NSF (grants #1531243 and #0619599) for funding of instrumentation in the Kuiper Materials Imaging and Characterization Facility at the Lunar and Planetary Laboratory, University of Arizona. Research supported by NASA grant #NNX15AJ22G.Google Scholar